Title：Multi-Mode Ultrasonic Intelligent Sensing and System Inspection
Speaker：Professor Guo Shifeng, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences
Time：15:00–16:00, Tuesday, October 24, 2023
Venue：Room 705, Graduate School Building
Speaker Biography：
Professor Guo Shifeng received his Ph.D. from the National University of Singapore. He is a Professor and Doctoral Supervisor at the Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences. He was selected as a National Young Expert (2018) and a Pearl River Talent (2020). He is a Senior Member of IEEE and serves as the Director of the Shenzhen Key Laboratory of Smart Sensing and System Inspection. His research focuses on novel ultrasonic testing methods and instrumentation. In the past three years, he has led projects including the National High-Level Talent Program, the National Natural Science Foundation Joint Key Project, the National Natural Science Foundation General Program, key provincial and municipal research projects, the Shenzhen Key Laboratory Program, and industry-funded collaborations. As first author or corresponding author, he has published 45 JCR Q1 papers in journals such as Nature Nanotechnology, IEEE Transactions, Composites Part B, and Mechanical Systems and Signal Processing. He holds over 50 patents in the United States, Singapore, and China.
Abstract：
Advanced manufacturing and intelligent manufacturing urgently require advanced intelligent inspection technologies to ensure structural quality and service safety. Focusing on fields such as aerospace and chip packaging, the research team centers on ultrasonic intelligent sensing and high-resolution imaging, dedicating efforts to the development of core technologies including novel ultrasonic sensors, advanced ultrasonic inspection/imaging methods, and instrumentation. By integrating artificial intelligence algorithms, the team achieves high-precision intelligent inspection of structural morphology and mechanical properties.
